The Development of Radiation Shielding Materials Involves Incorporating Lanthanum Oxide Dopants into Glass
Abstract:
The glass formula (60-x) P2O5: 15Na2O: 5ZnO: 10Al2O3: 10CaO: xLa2O3 where x is 0, 5, 10, 15 and 20 mol%, is produced by using the melt quenching technique for photon shielding applications. The glasses were investigated for their physical, transmission, x-ray and gamma-ray shielding properties. The results discovered an increase in density with higher concentrations of La3+ions. The transmission spectra of the glass show high er transparency compared to x-ray windows. In relative studies of gamma-ray properties between experimental and theoretical data, the mass attenuation coefficients (MAC), effective atomic number (Zeff), and effective elec tron density (Neff) increased with the rising of La3+ ions. Conversely, the half-value layer (HVL) decreased, in dicating an improvement in the radiation shielding material efficiency. In x-ray applications, the HVL decreased with an increase in La3+ ions content. The HVL value at a 20 mol% concentration of La3+ions is higher than standard materials at 120 kVp. The glass systems doped with La3+ ions could be potential candidates for x-ray and gamma-ray glass shielding in future applications.
